Abstract: Traditional crack detection methods often struggle with low efficiency and accuracy due to manual feature extraction and computational resource limitations. To overcome these challenges, we ...
XDA Developers on MSN
This ESP32-powered display is so powerful that it needs a second ESP32
We've talked a lot about ESP32-powered displays, but what about displays that pack two ESP32 chips inside? That's exactly ...
Abstract: This work presents an improved modeling approach using fractional differential equations (FDE) and stochastic processes for the I-V characteristics of commercial photovoltaic (PV) modules.
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