Testing digital designs usually requires one or more digital signals, some of which can be very difficult to generate. Pattern generators are specifically designed to address this problem. Whatever ...
Logic built-in self-test (LBIST), is a mechanism that lets an (IC) test the integrity of its own digital logic structures. LBIST operates by stimulating the logic-based operations of the IC and then ...
Logic BIST (LBIST) technology has been in use for decades. However, it did not enter the mainstream until recently. This article explores the traditional LBIST “Stumps” architecture and examines a new ...
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