Machine Design

NIST, Collaborators Develop New Way of Detecting the Defect Density in Transistors

Defects in transistors, such as unwanted impurities and broken chemical bonds in the various layers of the semiconductor, can limit their performance and reliability. These defects are becoming harder ...
TechNode

TSMC boosts 2nm test chip yield by 6%, potentially saving billions for clients

TSMC is working to optimize its 2nm (N2) technology by reducing variability and defect density, as the manufacturer aims to begin mass production of 2nm process chips in the second half of next year.
Mena FN

Capacity Soars 8X! 400G Optical Module Robot Test Station Breaks Through Mass Production Pain Points, Defect Rate Plummets 94%

(MENAFN- GetNews) 400G Mass Production Bottleneck Solved: How Robot Plug-in Test Station Fortifies Quality Control? As 400G optical modules become "essential components" for data center ...
AZOM

Raman Mapping for Structural and Electronic Analysis of Graphene

Originating as a theoretical prediction in the 1940s, with experimental isolation from graphite in 2004, graphene has quickly become a desirable quantum material used in various application areas, ...