[This article was first published in Army Sustainment Professional Bulletin, which was then called Army Logistician, volume 1, number 2 (November–December 1969), pages 8–11, 24–25.] “… in the process ...

proteanTecs and ELES have partnered together to enhance reliability testing with deep data analytics. This collaboration enables SoC manufacturers to improve their qualification envelope to achieve ...

Collaboration enables SoC manufacturers to improve their qualification envelope to achieve lifetime reliability, shorten their root cause analysis time, and reduce operational costs HAIFA, ...

In today’s digital economy, engineering leaders face a paradox. Businesses are demanding faster releases, but at the same time, customers and regulators are insisting on higher reliability than ever ...

The JEDEC 35 Standard (EIA/JESD35, Procedure for Wafer-Level Testing of Thin Dielectrics) describes voltage ramp (V-ramp) and current ramp (J-ramp) tests to monitor oxide integrity. These tests are ...

One-shot devices, which are engineered for one-time use and are often subject to destructive testing, represent an important class of critical components in areas ranging from aerospace to biomedical ...

SiC (silicon carbide) has established itself as an important material in the semiconductor market because it has many outstanding properties. In comparison with silicon, SiC offers a higher electrical ...